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Description

AC-SM-02DESCRIPTION Modified sample holder for nanoIR3, nanoIR2, nanoIR, and afm+ that allows room for taller samples to be placed on the stage for analysis.

Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 15 Tip Radius (Max): <10 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 3

we did not notice any surface or tip wear affecting the image

-- Included in the new MM-SCM-V3 Scanning Capacitance Microscopy solution for MultiMode

Mechanical

Tip Geometry: Rotated (Symmetric) Tip Height: 10 - 15 Front Angle: 15+/-2 Back Angle: 25+/-2 Side Angle: 17

5 Tip Radius (Nom): 30 Tip Radius (Max): 90 Tip Coating: Gold Tip Set Back (Nom): 4 Tip Set Back( RNG): 0 - 7

Cylindrical flat punch

ESP/ESPA AFM probes

Other applications of the SCM-PtSi probe include: conductivity measurements Electrical Force Microscopy (EFM)

For use on PeakForce QNM enabled AFMs only

2 female luer fittings

5 Cantilever Thickness (RNG): 5

Exchange/Return Notes