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FIB4-20042N m, 320kHz, 10nm Tip Radius, 200nm Wide Spike @ 4m DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 200nm Wide Spike @ 4m High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 20: 1 at 4um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 1. 2 0. 5 Back Angle: 1. 2 0. 5 Side Angle: 1. 2 0. 5 Tip Radius (Nom): 10 Tip Radius (Max): 15 Tip Set

Pyrolytic Graphite (PG) is a unique form of graphite manufactured by decomposition of a hydrocarbon gas at very high temperature in a vacuum furnace

PSFILM-12M

High aspect ratio probe for repeatable

Non-Magnetic Sample Holder for CP-II DESCRIPTION

Can be used for a wide range of nanotechnology

vertical edge height

2 Cantilever Geometry: Rectangular Cantilevers Number: 1

Precision-etched Tungsten wire for STM mode

A pack of High Aspect Ratio Probes

Bruker AFM Probes has introduced an improved version of its popular MLCT AFM probes

The moderately low nominal 5N/m spring constant is most suitable for soft polymer samples (typically in MPa range)

Prod # Description Style Length Metal Points - Width x Thickness 5367-7G PELCO® Pro Gold Plated Curved