Magnification Calibration MRS-3 - Modification

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Description

Magnification Calibration MRS-3 - ModificationDESCRIPTION Modify the MRS 3 to 3mm diameter x 0. 5mm thickness to fit into a TEM style holder. For use only in secondary or backscattered electron mode, not transmitted. The 10 x 50,000x Pitch Standard for Scanning Electron Microscopy Details of Traceability to NIST, NPL or ISO 9000 Compliance Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies and Profilometry STM, AFM, the

highly conductive epoxy for solderless connections and repairs of circuit boards

The Sample Bias Holder is included in the Scanning Capacitance Microscopy (SCM) option

Holder used to mount the ZnSe prism in the nanoIR system

Can also be used to bond thin samples together for cross section procedures

Standard slightly recessed 0

Grid Storage Box for 100 Grids

19mm) sold in package of 100

The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2

Hole: 100 microns

20nm Height

Veco Center Reference

Mounting MRS-3/4 Retainer on Hitachi Ø25x10mmxM4 Cylinder Mount

Exchange/Return Notes