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Description

PR-EX-TnIR-A-10DESCRIPTION SPECIFICATIONS 10 pack of probes for use in the nanoIR2 2S 2FS systems for AFM imaging in Tapping mode and IR spectral collection in contact mode. Also required for Tapping AFM IR chemical imaging where the feature is available. Gold coated, microfabricated silicon probes that are ~225 microns long and come pre mounted on half washer mounts for easy exchange in the AFM head. Shape: Rotated Height: 17 m (15 19 m)* Setback: 15 m (10 20 m)*

The smaller center square of 500 x 500µm contains circular pillars and holes as well as lines in both X- and Y-direction with a 5um pitch

so substantial tip angle decreases more when it is attached to a chip holder in your AFM with certain tilt angle (probably

Sample Certificate for MRS-4 (301KB PDF)

high amplitude force imaging in air

and 8mm in length

0 Cantilever Geometry: Rectangular Back Side Coating: Reflective Aluminum

The high nominal 40N/m spring constant is most suitable for stiff (typically GPa) samples

or CAT-PFQNM)

2 Cantilever Geometry: Rectangular Cantilevers Number: 3

5mm thick silicon die with thin 15nm Cr deposit pattern

For a calibrated version of this probe please see CLFC-NOBO

with little added operational cost