Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

Tap300-GStandard Tapping Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Standard Tapping Mode AFM Probe Monolithic silicon AFM probe for high frequency non contact and tapping mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. For

025mm in diameter

Hitachi M4 Mount Stand

4 to 50mm diameter

The AFM/STM disks are 20 gauge which is 0

After dicing or scribing acetone or MEK may be used to separate the specimen from the Wafer-Mount™ 559

dicing metal and optical single crystals

Super sharp tip for highest resolution combined with intermediate spring constant for applications including:

M4 Adapter to JEOL 12

The squares repeat every 10µm (0

350 to 700µm

These probes are for tapping mode imaging

Piezoelectric coefficient d33=7