Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

HS-100MGHeight Calibration Standard, 100 nm DESCRIPTION Height Calibration Standard, 100 nm The problem: Atomic Force Microscopy has become a valuable tool not only for visualization but also for performing accurate measurements on the nanometer and micrometer scale. In order to make the most of their measurement capabilities, AFM systems need to be properly calibrated. The solution: HS 100MG is one of the height standards introduced by BudgetSensors as a

220 - 250V

Properties & Chemical Composition of Mica Grade V1

resulting in four unique nominal values for force constant and resonant frequency

two (25mm and 35mm)

Cryogenic temperatures (suitability depends on matching properties)

each kit includes power pack and batter charger

Leica EM 6P

Calibration artifact

ø25mm (1") x 10mm (0

Width x Thickness 5367-19NM PELCO® Pro High Precision

Dual Geological Thin Section Holder

This cross-sectional sample holder is designed to hold a wafer cross-section upright for edge inspection and it can be used on all microscopes