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Description

PFTUNA0. 4N m, 70kHz, Pt Ir Tip Coating and Reflex Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS PFTUNA probes combine the low spring constant and high sensitivity of a nitride cantilever with a sharp, electrically conductive tip. When used with Brukers exclusive PeakForce TUNA mode, they enable an unprecedented level of high resolution electrical characterization on fragile samples. Tip Geometry: Rotated (Symmetric) Tip Height: 2. 5 8

PeakForce Tapping Hi-Res Probe B

One cartridge for IRIS STM TERS

FastScan-C probes are designed specifically for imaging in fluid on the Dimension FastScan AFM

025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom): 7 Cantilever Thickness (RNG): 6

Tip Geometry: Standard Tip Height: 12

- ZYB Grade

A pack of Silicon Nitride Probes

For stiffer samples

5 Tip Radius (Nom): 2 Tip Radius (Max): 12 Tip Set Back (Nom): 4 Tip Set Back( RNG): 0 - 7

Resonant frequency 55 kHz in air

15 Cantilever Geometry: Rectangular Cantilevers Number: 1 Back Side Coating: Reflective Aluminum

Bruker's MESP-LM-V2 is the established choice for Magnetic Force Microscopy