PELCO® Silicon Nitride Coated 3mm Disks (blanks)

Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

PELCO® Silicon Nitride Coated 3mm Disks (blanks)DESCRIPTION PRODUCT SPECIFICATIONS These 3mm silicon disks have a 50nm ultra low stress silicon nitride layer (Si3N4) on both sides and can be used as specimen disks for AFM applications which need a Si3N4 background. Provide smooth background: Surface roughness has RMS (Rg) of 0. 65 0. 06nm which gives a mean roughness (RA) of 0. 45 0. 02nm more information on silicon nitride support films Film thickness: 50nm ultra low stress Si3N4 on both sides

Replacement scanner springs for all V and VLH type scanners DESCRIPTION

8mm tip (Model PT10) is recommended

New super sharp probes for highest resolution imaging in air on the widest sample range

Supplied in 20ml bottle with dispenser tip

Max Effective Length = 700 nm

See the cantilever orientation diagram here

It replaces the previous #607-AFM Grating Replica with 463nm pitch

Image at top demonstrates height calibration at 1nm (red line profile) and 3nm (green line profile) on the standard to indicate a sharp tip

May be applied with a spatula

or Torsional Resonance mode

Molybdenum and Aluminum grids are packaged in 25's Pitch: Is 1"/mesh or 25

Roughness: 2nm